48th Annual Frontiers in Education (FIE) Conference
In this work, which is intended to be a Full Paper in the Innovative Practice Category, the implementation of an improved placement exam that increased the pass rate in a junior level systems course in the author’s electrical engineering department by 15% is presented. For almost 30 years the author’s EE department has used a face to face exam to place students in a junior level circuits and systems course or into a review workshop. The details of the exam and suggestions about future use in conjunction MyOpenMath analytics to increase student success are also given.
David Parent. "Development of a placement exam to increase student success in a junior level circuits and systems class" 48th Annual Frontiers in Education (FIE) Conference (2018).