Master of Science (MS)
Noise, Partition Noise, Reset Noise
Engineering, Electronics and Electrical
As Complementary Metal Oxide Semiconductor (CMOS) technology scales down,
partition noise may start to play a bigger role in reducing the signal-to-noise ratio (SNR)
in sample-and-hold circuits and other capacitive sensing circuits that reset the voltage
across a capacitor. Previous studies on partition noise lack a reliable and accurate
measurement method to quantify partition noise. In our study, we have developed a
method using Technology Computer Aided Design (TCAD) simulations to estimate
partition noise. Through simulation, we determined the transistor dimensions and sense
capacitance required to measure partition noise. Furthermore, we designed a test circuit
based on our simulation results with the flexibility to study partition noise. The test
circuit has a buffer that allows us to measure partition noise without interference from
test measurement equipments. Finally, we presented a method to measure and extract
partition noise using our test circuit.
Lin, Carol Cui Lan, "Partition Noise Extraction Using TCAD Simulations" (2010). Master's Theses. 3816.