Introducing new resonant soft x-ray scattering capability in SSRL

Publication Date

6-1-2025

Document Type

Article

Publication Title

Review of Scientific Instruments

Volume

96

Issue

6

DOI

10.1063/5.0257317

Abstract

Resonant soft x-ray scattering (RSXS) is a powerful technique for probing both spatial and electronic structures within solid-state systems. We present a newly developed RSXS capability at beamline 13-3 of the Stanford Synchrotron Radiation Lightsource, designed to enhance materials science research. This advanced setup achieves a base sample temperature as low as 9.8 K combined with extensive angular motions (azimuthal ϕ and flipping χ), enabling comprehensive exploration of reciprocal space. Two types of detectors—an Au/GaAsP Schottky photodiode and a charge-coupled device detector with over 95% quantum efficiency—are integrated to effectively capture scattered photons. Extensive testing has confirmed the enhanced functionality of this RSXS setup, including its temperature and angular performance. The versatility and effectiveness of the system have been demonstrated through studies of various materials, including superlattice heterostructures and high-temperature superconductors.

Funding Number

DE-AC02-76SF00515

Funding Sponsor

SLAC National Accelerator Laboratory

Comments

The published version of the article will be available on 2026-06-01 due to embargo policy

Department

Mechanical Engineering

Share

COinS