Ga2O3 TCAD Mobility Parameter Calibration Using Simulation Augmented Machine Learning With Physics-Informed Neural Network
Publication Date
1-5-2026
Document Type
Article
Publication Title
IEEE Transactions on Electron Devices
Volume
73
Issue
2
DOI
10.1109/TED.2025.3648986
First Page
775
Last Page
781
Abstract
In this article, we demonstrate the feasibility of performing automatic technology computer-aideddesign (TCAD) parameter calibration and extraction using machine learning (ML), with the machine trained solely by TCAD-simulation data. The methodology is validated using experimental data. Schottky barrier diodes (SBDs) with different effective anode workfunctions (WF) are fabricated with emerging ultrawide bandgap material, Gallium Oxide (Ga2O3), and are measured at various temperatures (T). Their current-voltage (I–V) curves are used for automatic Ga2O3 Philips unified mobility (PhuMob) model parameters calibration. Five critical PhuMob parameters (µmax, µmin, Nref, α, and θ) were calibrated. The machine consists of an autoencoder (AE) and a neural network (NN) and is trained solely by TCAD simulation data with variations in WF, T, and the five PhuMob parameters (seven variations in total). Then, Ga2O3 PhuMob parameters are extracted from the noisy experimental curves. Subsequent TCAD simulation using the extracted parameters shows that the quality of the parameters is as good as an expert’s calibration at the preturned-on regime, but not in the ON-state regime. By using a simple physics-informed NN (PINN), the machine performs as well as the human expert in all regimes.
Funding Number
2046220
Funding Sponsor
National Science Foundation
Keywords
Gallium oxide (Ga₂O₃), machine learning (ML), physics-informed neural network (PINN), simulation, technology computer-aided design (TCAD)
Department
Electrical Engineering
Recommended Citation
Edric Khai Jieh Ong, Le Minh Long Nguyen, Matthew Eng, Yuhao Zhang, and Hiu Yung Wong. "Ga2O3 TCAD Mobility Parameter Calibration Using Simulation Augmented Machine Learning With Physics-Informed Neural Network" IEEE Transactions on Electron Devices (2026): 775-781. https://doi.org/10.1109/TED.2025.3648986