Thermal Behavior Characterization and Mechanical Property Degradation of Sn-1Ag-0.7Cu-5BixIn/Cu Joints
Publication Date
5-27-2026
Document Type
Article
Publication Title
International Journal of Advanced Manufacturing Technology
Volume
145
Issue
1-2
DOI
10.1007/s00170-026-18377-y
First Page
425
Last Page
437
Abstract
Based on calculation of phase diagrams (CALPHAD)-assisted phase fraction calculations, Sn-1Ag-0.7Cu-5Bi-xIn (x = 4, 8, 15, 17 wt%, hereafter denoted as xIn) alloys were designed to meet long-term high-temperature service requirements in solder joints. Bi and In were added to offset performance losses resulting from reducing Ag content. With Bi fixed at 5 wt%, this study investigated the effects of varying In content on melting behavior, microstructure, mechanical properties, and fracture mechanisms. Results showed that increasing In content eliminated Bi-rich particles, and at ≥ 15 wt% In, InSn₄ phases appeared. The interfacial IMC transformed from Cu₆Sn₅ to Cu₆(Sn, In)₅, with the amount of InSn₄ and secondary phases increasing with In content. During isothermal aging at 170 °C, the 4In joints formed Cu-rich layers, causing stress concentration and interfacial cracking. In the 8In joints, Cu and In diffusion converted Cu₆(Sn, In)₅ to Cu₃(Sn, In), generating residual stresses and interfacial cracks. Higher In contents lowered melting points, accelerated diffusion, and stabilized Cu₆(Sn, In)₅, thereby improving joint reliability. These findings provide valuable insights for controlling interfacial intermetallic compounds and designing solder joints.
Funding Number
202301BC070001-001
Funding Sponsor
Yunnan Provincial Science and Technology Department
Keywords
IMC, In-doped low silver SAC joints, Mechanical properties, Microstructure
Department
Aviation and Technology
Recommended Citation
Zhou Li, Hao Yang, Xiaojing Wang, Yanlai Wang, and David P. Yan. "Thermal Behavior Characterization and Mechanical Property Degradation of Sn-1Ag-0.7Cu-5BixIn/Cu Joints" International Journal of Advanced Manufacturing Technology (2026): 425-437. https://doi.org/10.1007/s00170-026-18377-y