Publication Date
1993
Degree Type
Thesis
Degree Name
Master of Science (MS)
Department
Materials Engineering
Recommended Citation
Ge, Jiaming, "Passivation film damage during focused ion beam IC modification" (1993). Master's Theses. 539.
DOI: https://doi.org/10.31979/etd.mdu2-ymj4
https://scholarworks.sjsu.edu/etd_theses/539
COinS
